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Pipelined analog to digital converters (ADCs) have become the architecture of choice for high-speed and moderate- to high-resolution devices. Subsequently, different techniques of fault diagnosis by the built-in self-test (BIST) system have been developed.
An ideal reference for graduate students and researchers within electrical, electronics and computer engineering, this book provides a rigorous, theoretical and mathematical analysis for the design of pipelined ADCs, along with detailed practical aspects of implementing it in very large-scale integration (VLSI). In each chapter a unique fault diagnosis technique for pipelined ADC has been proposed.
