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Nanometrology Using the Transmission Electron Microscope

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The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized...
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  • 12 October 2015
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The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and biomolecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.
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Price: £52.50
Pages: 68
Publisher: Morgan & Claypool Publishers
Imprint: Morgan & Claypool Publishers
Publication Date: 12 October 2015
Trim Size: 10.00 X 7.00 in
ISBN: 9780750327992
Format: Paperback
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Vlad Stolojan is a Lecturer in nanomaterials characterization, working in the Advanced Technology Institute at the University of Surrey. He joined the Nano-Electronics Centre at Surrey in 2001 as an expert in electron microscopy and energy-loss spectroscopy. He is the author of more than 80 peer-reviewed publications, is the member of the Institute of Physics and a fellow of the Royal Microscopical Society.
Table of Contents: Introduction / The Transmission Electron Microscope / Imaging / Resolution / Image Calibration / Sample Orientation / Modes of Imaging and Diffraction / Spectroscopy / Energy-dispersive X-ray Spectroscopy (EDX) / Electron Energy Loss Spectroscopy (EELS)