{"product_id":"nanoscale-standards-by-metrological-afm-and-other-instruments-1755079225852","title":"Nanoscale Standards by Metrological AFM and Other Instruments","description":"\u003cp\u003eThis book reviews nanometrological standards before proceeding to detail pitch, step height, line width, nanoparticle size, and surface roughness. Essential for users making quantitative nanoscale measurements, in a commercial or academic research setting, or involved in engineering nanometrology for quality control in industrial applications.\u003c\/p\u003e","brand":"Ichiko Msum","offers":[{"title":"Default Title","offer_id":50982232555812,"sku":"9780750331920","price":25.0,"currency_code":"GBP","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0880\/7635\/3828\/files\/CoreSourceHub_2afa1d68-6201-48b8-bf06-cd0709859713.jpg?v=1755085158","url":"https:\/\/indiepubs.co.uk\/products\/nanoscale-standards-by-metrological-afm-and-other-instruments-1755079225852","provider":"IndiePubs UK","version":"1.0","type":"link"}